High Temperature Quartz Crystal PC Based Film Thickness Monitors


Colnatec created the world’s first commercial high temperature (500 C) real-time quartz crystal based film thickness monitor. Originally designed to solve problems with monitoring CIGS thin film photovoltaic cells, the technology quickly became adopted by manufacturers using Atomic Layer Deposition (ALD), Chemical Vapor Deposition (CVD) and a variety of Physical Vapor Deposition (PVD) processes. We have sold over 500 systems into the thin film optics, semiconductor, surface chemistry and flat panel display industries, worldwide.

Colnatec LLC was founded in 2010 in Gilbert, Arizona but eventually moved to beautiful Greenville, South Carolina (USA)., and has been providing quality film thickness monitors, such as our EonLT, ever since.

The original 500C Quartz Crystal Film Thickness Monitor
The only Independently Heated QCM system in the world!
From 20 to 500C, crystals for all types of coating processes
Full Featured Windows Software Included with every EonLT and Eon System