High Temperature Quartz Crystal PC Based Film Thickness Monitors
Colnatec created the world’s first commercial high temperature (500 C) real-time quartz crystal based film thickness monitor. Originally designed to solve problems with monitoring CIGS thin film photovoltaic cells, the technology quickly became adopted by manufacturers using Atomic Layer Deposition (ALD), Chemical Vapor Deposition (CVD) and a variety of Physical Vapor Deposition (PVD) processes. We have sold over 500 systems into the thin film optics, semiconductor, surface chemistry and flat panel display industries, worldwide.
Colnatec LLC was founded in 2010 in Gilbert, Arizona but eventually moved to beautiful Greenville, South Carolina (USA)., and has been providing quality film thickness monitors, such as our EonLT, ever since.